Description |
1 online resource (xliii, 420 pages) : illustrations (some color) |
Series |
Nanoscience and technology |
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Nanoscience and technology.
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Contents |
Robert W. Stark and Martin Stark: Higher Harmonics in Dynamic Atomic Force Microscopy -- Ute Rabe: Atomic Force Acoustic Microscopy -- Tilman E. Schf̃fer, Boris Anczykowski, Harald Fuchs: Scanning Ion Conductance Microscopy -- Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner: Spin-polarized Scanning Tunneling Microscopy -- Ferry Kienberger, Hermann Gruber, and Peter Hinterdorfer: Dynamic Force Microscopy and Spectroscopy -- Egbert Oesterschulze, Leon Abelmann, Arnout van den Bos, Rainer Kassing, Nicole Schwendler, Gunther Wittstock, and Christiane Ziegler: Sensor Technology for SPM and new Applications -- Malgorzata Lekka and Andrzej J. Kulik: Quantitative Nanomechanical Measurements in Biology -- Pascal Vairac and Bernard Cretin: Scanning Microdeformation Microscopy : Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale -- P. Girard and A.N. Titkov: Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interests and Applications for Characterisations of Semiconductor Materials and Devices -- Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, and Maria Allegrini: Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures -- Vittoria Raffa, Piero Castrataro, Arianna Menciassi, and Paolo Dario: Focused Ion Beam as a Scanning Probe: Methods and Applications |
Summary |
Annotation Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques |
Analysis |
chemie |
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chemistry |
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fysische chemie |
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physical chemistry |
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polymeren |
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polymers |
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vaste stoffen |
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solids |
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fysica |
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physics |
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oppervlakten |
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surfaces |
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grensvlak |
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interface |
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analytische scheikunde |
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analytical chemistry |
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nanotechnologie |
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nanotechnology |
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Chemistry (General) |
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Chemie (algemeen) |
Bibliography |
Includes bibliographical references and index |
Notes |
Print version record |
In |
Springer e-books |
Subject |
Scanning probe microscopy.
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Materials -- Microscopy.
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Engineering.
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Polymers.
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Microscopy, Scanning Probe
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Engineering
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Polymers
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engineering.
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polymers.
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SCIENCE -- Nanostructures.
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Chimie.
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Science des matériaux.
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Materials -- Microscopy
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Scanning probe microscopy
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Form |
Electronic book
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Author |
Bhushan, Bharat, 1949-
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Fuchs, H. (Harald)
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ISBN |
9783540274537 |
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3540274537 |
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