| Description |
1 online resource (369 pages) |
| Series |
Springer Series in Surface Sciences |
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Springer series in surface sciences
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| Contents |
Ellipsometry: A Survey of Concept / Christoph Cobet -- Part I: Biomolecules at Surfaces -- Adsorption of Proteins at Solid Surfaces / Hans Arwin -- DNA Structures on Silicon and Diamond / Simona D. Pop, Karsten Hinrichs, Sylvia Wenmackers, Christoph Cobet, Norbert Esser and Dietrich R.T. Zahn -- Part II: Smart Polymer Surfaces and Films -- Glass Transition of Polymers with Different Architectures in the Confinement of Nanoscopic Films / Michael Erber, Martin Tress and Klaus-Jochen Eichhorn -- Polymer Brushes, Hydrogels, Polyelectrolyte Multilayers: Stimuli-Responsivity and Control of Protein Adsorption / Eva Bittrich, Petra Uhlmann, Klaus-Jochen Eichhorn, Karsten Hinrichs, Dennis Aulich and Andreas Furchner -- Part III: Nanostructured Surfaces and Organic/Inorganic Hybrids -- Systems of Nanoparticles with SAMs and Polymers / Thomas W.H. Oates -- Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques / Keith B. Rodenhausen, Daniel Schmidt, Charles Rice, Tino Hofmann, Eva Schubert and Mathias Schubert -- Polarizing Natural Nanostructures / Kenneth Järrendahl and Hans Arwin -- Part IV: Thin Films of Organic Semiconductors for OPV, OLEDs and OTFT -- Polymer Blends and Composites / Stergios Logothetidis -- Small Organic Molecules / Ovidiu D. Gordan and Dietrich R.T. Zahn -- Part V: Developments in Ellipsometric Real-Time/In-situ Monitoring Techniques -- Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Solid-Liquid Interface / Ralf P. Richter, Keith B. Rodenhausen, Nico B. Eisele and Mathias Schubert -- TIRE and SPR-Enhanced SE for Adsorption Processes / Hans Arwin -- In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates / Agiris Laskarakis and Stergios Logothetidis -- Application of In-situ IR-Ellipsometry in Electrochemistry to Study Ultra-Thin Films / Jörg Rappich, Karsten Hinrichs, Guoguang Sun and Xin Zhang -- Part VI: Infrared Spectroscopic Methods for Characterization of Thin Organic Films -- Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy / Katy Roodenko, Damien Aureau, Florent Yang, Peter Thissen and Jörg Rappich -- Brilliant Infrared Light Sources for Micro-Ellipsometric Studies of Organic Thin Films / Michael Gensch -- Part VII: Optical Constants -- Common Polymers and Proteins / Andreas Furchner and Dennis Aulich -- Organic Materials for Optoelectronic Applications / Andreas Furchner and Dennis Aulich |
| Summary |
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces |
| Bibliography |
Includes bibliographical references and index |
| Notes |
English |
|
Print version record |
| Subject |
Ellipsometry.
|
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Surfaces (Technology)
|
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SCIENCE -- Physics -- Optics & Light.
|
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TECHNOLOGY & ENGINEERING -- Mechanical.
|
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Chimie.
|
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Science des matériaux.
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Ellipsometry
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Surfaces (Technology)
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| Form |
Electronic book
|
| Author |
Hinrichs, Karsten
|
|
Eichhorn, Klaus-Jochen
|
| ISBN |
9783642401282 |
|
3642401287 |
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3642401279 |
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9783642401275 |
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