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Book Cover
E-book
Author Chen, C. Julian, author.

Title Introduction to scanning tunneling microscopy / C. Julian Chen
Edition Third edition
Published Oxford : Oxford University Press, 2021

Copies

Description 1 online resource (lxx, 452 pages) : illustrations
Series Monographs on the physics and chemistry of materials ; 69
Monographs on the physics and chemistry of materials ; 69.
Contents Tunneling phenomenon -- Tunneling matrix elements -- Atomic forces -- Atomic forces and tunneling -- Nanometer-scale imaging -- Atomic-scale imaging -- Imaging wavefunctions -- Nanomechanical eects -- Piezoelectric scanner -- Vibration isolation -- Electronics and control -- Mechanical design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy
Summary The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic
Notes This edition also issued in print: 2021
Bibliography Includes bibliographical references and index
Audience Specialized
Notes Online resource; title from PDF title page (Oxford Scholarship Online, viewed on August 6, 2021)
Subject Scanning tunneling microscopy.
Microscopy, Scanning Tunneling
Scanning tunneling microscopy
Form Electronic book
ISBN 9780191889905
0191889903
9780192598561
0192598562