|
A Scan Chain Based SEU Test Method for Microprocessors / / Yaqing Chi [and others]
|
2013
|
1
|
|
Scan Design Costs. / 9.8.
|
1994
|
1
|
|
Scan Designs for RTL -- / 7.6.
|
2011
|
1
|
|
Scan Parameters and CT Radiation Dose / / Sarabjeet Singh and Mannudeep K. Kalra --
|
2012
|
1
|
|
Scan Verification -- / 17.
|
2014
|
1
|
|
Scandal: Aghas and Hodjas -- / pt. IV.
|
2002
|
1
|