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Book Cover
E-book
Author Sato, Yoshihiko.

Title Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman
Edition 1st ed
Published New York : Industrial Press : Society of Manufacturing Engineers, 2005

Copies

Description 1 online resource (x, 206 pages) : illustrations
Contents Ch. 1. VA tear-down : what it is, how it developed -- Ch. 2. Value analysis and VA tear-down -- Ch. 3. The VA tear-down process -- Ch. 4. Applying VA tear-down to issues of concern -- Ch. 5. Evaluating VA tear-down results -- Ch. 6. Other measures of competitiveness with VA tear-down
Summary "Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing executives, and research and development executives. It is applicable to many other industries besides manufacturing, including those in the service sector."--Jacket
Bibliography Includes bibliographical references (page 199) and index
Notes Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
English
Print version record
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
Subject Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
Performance technology.
Labor productivity.
Performance technology
Labor productivity
Engineering economy
Industrial productivity
New products
Value analysis (Cost control)
Management.
Business & Economics.
Management Styles & Communication.
Form Electronic book
Author Kaufman, J. Jerry.
LC no. 2004019919
ISBN 9781615835799
1615835792
9780831132033
0831132035